IEC 62373-1 Ed. 1.0 b:2020

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IEC 62373-1 Ed. 1.0 b:2020

$82.00

Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) – Part 1: Fast BTI test for MOSFET
standard by International Electrotechnical Commission, 07/15/2020

Format: PDF      In Stock

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Description

IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).

This document also defines the terms pertaining to the conventional BTI test method.

Product Details

Edition:
1.0
Published:
07/15/2020
Number of Pages:
44
File Size:
1 file , 1.7 MB